[SOLVED] Questions on Grade 0 Variants of Embedded Power ICs

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cross mob
User16111
Level 1
Level 1
Hi,

I have the following questions:

1- Is the LIN block exactly the same in the TLE9873QX_40 variant as the one qualified in the TLE9879QX variant used to qualify the other parts?

2- Where any of the Test Program changes for the Grade 0 parts related at all to LIN?* If so what are the details of those changes?

3- Do we have any comparative wafer test data between the QXA versions and the new QXW, QXH versions to show that the LIN performance is essentially unchanged?

Thanks in advance.
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1 Reply
pestadieu
Employee
Employee
1- The LIN block is exactly the same.

2- The LIN test program has no changes for Grade 0

3- Since there are no changes in LIN test program the test performance is identical.
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