May 03, 2019
04:26 AM
- Mark as New
- Bookmark
- Subscribe
- Mute
- Subscribe to RSS Feed
- Permalink
- Report Inappropriate Content
May 03, 2019
04:26 AM
Hi,
I have the following questions:
1- Is the LIN block exactly the same in the TLE9873QX_40 variant as the one qualified in the TLE9879QX variant used to qualify the other parts?
2- Where any of the Test Program changes for the Grade 0 parts related at all to LIN?* If so what are the details of those changes?
3- Do we have any comparative wafer test data between the QXA versions and the new QXW, QXH versions to show that the LIN performance is essentially unchanged?
Thanks in advance.
I have the following questions:
1- Is the LIN block exactly the same in the TLE9873QX_40 variant as the one qualified in the TLE9879QX variant used to qualify the other parts?
2- Where any of the Test Program changes for the Grade 0 parts related at all to LIN?* If so what are the details of those changes?
3- Do we have any comparative wafer test data between the QXA versions and the new QXW, QXH versions to show that the LIN performance is essentially unchanged?
Thanks in advance.
1 Reply
May 03, 2019
04:29 AM
- Mark as New
- Bookmark
- Subscribe
- Mute
- Subscribe to RSS Feed
- Permalink
- Report Inappropriate Content
May 03, 2019
04:29 AM
1- The LIN block is exactly the same.
2- The LIN test program has no changes for Grade 0
3- Since there are no changes in LIN test program the test performance is identical.
2- The LIN test program has no changes for Grade 0
3- Since there are no changes in LIN test program the test performance is identical.