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  1. #11
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    Does TLE9879 power sequence meet LV124 automotive test standard?

    The TLE9879 is tested according to LV124 test standard.

    Is there incorrect LIN communication mode when VS (voltage slope) rise times are slow during TLE9879 power-up sequence test?

    In the car, we expect every possible voltage slope and transition. Even slower slopes should not have an influence on the functionality.
    When voltage slope transitions are slow during power up sequence test, if the transceiver is in LIN Normal Mode (LNM) instead of LIN Receive Only Mode (LROM), VS undervoltage can be triggered, which causes the LIN to go in Receive-only mode.

    LNM to LROM transition is also executed when:
    • MODE is configured to LIN Receive-Only Mode or
    • Feedback signals of Mode and Slope Mode are not ok or
    • VS undervoltage flag (VS_UV_STS) is set or
    • LIN transceiver OT_STS or OC_STS are set or
    • TXD_TMOUT is set

    LROM to LNM transition is executed when:
    • MODE is configured to LIN Normal Mode and
    • Feedback signals of Mode and Slope Mode are ok and
    • VS undervoltage flag (VS_UV_STS) is not set and
    • LIN transceiver OT_STS and OC_STS are not set and
    • no TXD_TMOUT is set

    For further information, please refer to the TLE987xQX User Manual (Page 651) under User Manual in the below link.
    https://www.infineon.com/cms/en/product/microcontroller/embedded-power-ics-system-on-chip-/3-phase-bridge-driver-integrated-arm-cortex-m3/#!documents

  2. #12
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    TLE9844: Does attenuator value of ADC1 have character variation?

    Is it safe to deviate ±x% from the specified attenuator value of ADC1 mentioned in TLE9844 datasheet (P_8.1.x)?

    This is the value of capacitor ratio. In case of variation it is "trimmed" with the gain setting. So it is recommended to use (for calculation) only the typical value.

  3. #13
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    Internal temperature sense & ADC2 clarifications

    Question1: To enable the internal measurement on ADC2 of TLE9879, is it possible to implement an expected measurement channel sequence scheme using the Sequence Registers?
    Answer1: In general the ADC2 should be used as supervision ADC and it is also used for intrinsic protection mechanisms of the device. (E.g. over temperature switch off). You can adjust certain thresholds to adopt it to the application requirements. (e.g. Vs undervoltage)
    For flexible user definable measurements, the ADC1 - the user ADC can be used

    Question2: Why some channels are prioritized in TLE987x?
    Answer2: In TLE987x Channels 0 - 5 can be fully programmed. Several Sequence registers, especially for channels 6-9, are protected to ensure a fast update of measurement results used for internal diagnosis. Hence the channels 6 and 7 are prioritized and are measured more often. The high prioritization is given by an enabled measurement for each sequence. They cannot be switched off. All other channels are not enabled in much less sequences. Thus, for enabled channels (not 6,7) the update rate (periodicity) is lower, but defined by the channels 6 and 7. Hence, overall periodicity is mainly determined by these two channels.

    Question3: Why some sequence registers are not writable by SW in TLE987x?
    Answer3: The Channel Controller can be configured by the registers listed in Table 166. The registers which cannot be written by the user have the attribute rwp (can be modified only by hardware and firmware, not by software). xyz_int registers are for internal use, but you can read the configured values. The idea of the ADC2 is mostly for internal purpose with a very strict pre-defines structure and update rate. The user can access / read the ADC2-results and also vary certain thresholds, to make use of the intrinsic device protection. But recommendation is clearly not to change the update rates of the protected channels. Therefore they are also marked as volatile const.

    Please Note: The ePower user has to differentiate between ADC2 (just use it as it is) and ADC1, where there are many flexible ways for configuration and control.
    For motor control ADC1 has to be used.

  4. #14
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    Questions on Grade 0 Variants of ePower

    Question1: Is the LIN block exactly the same in the TLE9873QX_40 variant as the one qualified in the TLE9879QX variant used to qualify the other parts?
    Answer1: The LIN block is exactly the same.

    Question2: Were any of the Test Program changes for the Grade 0 parts related at all to LIN? If so what are the details of those changes?
    Answer2: The LIN test program has no changes for Grade 0.

    Question3: Do we have any comparative wafer test data between the QXA versions and the new QXW, QXH versions to show that the LIN performance is essentially unchanged?
    Answer3: Since there are no changes in LIN test program the test performance is identical.

  5. #15
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    Using the TLE98xx bootloader

    The device can be updated using FAST LIN BSL bootloader, which is already integrated.
    To evaluate this function you can order the uIO-Stick from our preferred design house Hitex.

    Link to order the uIO-Stick:

    https://www.ehitex.de/en/usb-applica...2529/uio-stick
    The views expressed here are my personal opinions, have not been reviewed or authorized by Infineon and do not necessarily represent the views of Infineon.

  6. #16
    New Member New Member EmbeddedSWEngrWannab is on a distinguished road
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    Which timer input can be used to capture and count just rising edges of a 5MHz input square wave? Just to capture the count value every 8ms. I've read through timers 2 and 21 they don't seem to support just capture and counting a value and allowing a read. Is this possible without using CPU bandwidth other than to read the value every 8ms. During the 8ms event, the counter would be disabled and once the value is captured and routine is complete then counter would be reset to 0x0000 and restarted. I read the data sheet again and see. I think I'm going to check timer 3 as well.
    Last edited by EmbeddedSWEngrWannab; Oct 24th, 2019 at 11:22 AM.

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