Not applicable
Feb 10, 2016
05:41 PM
- Mark as New
- Bookmark
- Subscribe
- Mute
- Subscribe to RSS Feed
- Permalink
- Report Inappropriate Content
Feb 10, 2016
05:41 PM
Hello, we're struggling to create some built-in test software for the TC1793 that will verify that expected traps occur when a RAM or flash uncorrectable ECC error is detected. Specifically, we want to be able to test LMU and DSPR RAMs, and internal flash for ECC double-bit errors. Among other things, we've tried flipping a pair ECC bits via the SFAGEN register, but don't get a trap. Does someone have an existing code snippet or additional documentation that describes how to cause ECC double bit errors in these RAMs or internal flash for test purposes?
Thanks!
Thanks!
Labels
- Tags:
- IFX
1 Reply
Not applicable
Feb 11, 2016
03:24 PM
- Mark as New
- Bookmark
- Subscribe
- Mute
- Subscribe to RSS Feed
- Permalink
- Report Inappropriate Content
Feb 11, 2016
03:24 PM
I'm having the same problem a few days ago. Does anyone have any solution to recommend?