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puchman568
Feb 10th, 2016, 05:41 PM
Hello, we're struggling to create some built-in test software for the TC1793 that will verify that expected traps occur when a RAM or flash uncorrectable ECC error is detected. Specifically, we want to be able to test LMU and DSPR RAMs, and internal flash for ECC double-bit errors. Among other things, we've tried flipping a pair ECC bits via the SFAGEN register, but don't get a trap. Does someone have an existing code snippet or additional documentation that describes how to cause ECC double bit errors in these RAMs or internal flash for test purposes?

Thanks!

manic348
Feb 11th, 2016, 03:24 PM
I'm having the same problem a few days ago. Does anyone have any solution to recommend?