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Jul 11, 2014
01:45 AM
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Jul 11, 2014
01:45 AM
Team,
how does TLP fit to IEC61000-4-2? Can you quantify it?
Thanks,
how does TLP fit to IEC61000-4-2? Can you quantify it?
Thanks,
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ESD Protection Forum
2 Replies
Jul 11, 2014
02:19 AM
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Jul 11, 2014
02:19 AM
Hi SWhiley,
in general there is no correlation between standards and TLP measurement results allowed, because generation of the test signal is different and also the DUT sensitivity
against waveform parameters (e.g. rise time) is most likely different.
However under determined conditions an approximation can be made. For a concrete example I recommend to take a look on the Infineon Application Note AN210, "Effective ESD Protection Design at System Level Using VF-TLP Characterization Methodology", Page 18, Chapter 2.7: "How TLP fits to IEC 61000-4-2 ?" LINK.
Regards,
E.B.
in general there is no correlation between standards and TLP measurement results allowed, because generation of the test signal is different and also the DUT sensitivity
against waveform parameters (e.g. rise time) is most likely different.
However under determined conditions an approximation can be made. For a concrete example I recommend to take a look on the Infineon Application Note AN210, "Effective ESD Protection Design at System Level Using VF-TLP Characterization Methodology", Page 18, Chapter 2.7: "How TLP fits to IEC 61000-4-2 ?" LINK.
Regards,
E.B.
Not applicable
Jul 17, 2014
12:56 AM
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Jul 17, 2014
12:56 AM
many thanks for AN210, good tip.